Microscope Lamps and Accessories
Electron Microscopy Sciences SEM Tin On Carbon Medium Resolution Test Specimen, JEOL Stub
Tin on Carbon is an alternate test specimen for medium resolution, and for the daily basic checking of your instrument performance. This specimen consists of a dispersion of tin spheres, within the size range 10 - 40 nm, on a carbon substrate. Ideal for astigmatism correction, it is also recommended for use in SEM's employed in the semi-conductor industry where the usual gold on carbon specimen cannot be used because of the risk of gold poisoning.
Type: JEOL Stub
Electron Microscopy Sciences Thin Sample Holder, 15 mm Pin
Ideal for examination cross section of thin samples, such as wafers, multi-layer of capacitors, plastics, metals, etc. For ISI, JEOL, TOPCON: double set screw for a secure holding of the specimen during observation. 15mm(dia). X 10mm(H), 6.4mm split
Electron Microscopy Sciences Walton & Beckett Graticule G24, 19 mm, 5:1 ratio
The Walton and Beckett graticule is for counting fibrous dust (asbestos or glass fibers) and particularly where the majority of fibers to be counted are shorter than 5 microns. The circle is divided into four by two diametrical lines scaled in units of 5 and 3 microns respectively. 3 and 5 microns are the critical measurements of fiber lengths and diameters used in fiber counting. Walton and Beckett include shapes with an aspect ratio of 3:1 or 5:1 for comparing to fibers.
IMPORTANT NOTE: The circle on these Walton & Beckett graticules must represent 100 microns at the stage and each one must be manufactured to the individual instrument. 5:1 ratio is useful where the majority of fibers to be counted are shorter than 5 um.
Size: 19 mm
Cole-Parmer Meiji Techno MA506 Microscope Eyepiece Reticle, 10 mm/0.1 mm scale
Use these micrometers to make quick and accurate measurements of your specimen. Eyepiece reticles are available with a crosshair scale or a 10 mm scale in 0.1 mm divisions; stage micrometers are available with a 1 mm scale in 0.01 mm divisions or with a 0.04" scale in 0.001" divisions. Use stage micrometers with any microscope.
Electron Microscopy Sciences Omniprobe FIB Lift-Out Grid 4-Post, Copper
Custom 4-post lift-out grids for in-situ lift-out. Include multiple indexed mounting locations, two with vertical bars attachment surfaces and two with "V" shaped alignment surfaces. Sides have lower profile for easier access to outermost posts. 3 mm diameter.
Material: Copper
Electron Microscopy Sciences PS5 Micrometer Standard with Graticules Cert
These stage micrometers are available with a calibration certificate that provides traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, necessary under ISO provisions. The glass discs are mounted in stainless steel slides with engraved serial numbers. Each slide is supplied in a polished wooden storage case. A Certificate of Comparison from Pyser-SGI, Graticules Division compares the scale to a NPL calibrated in-house standards. A statemen is provided on the accuracy of the item with respect to these standards.
Electron Microscopy Sciences EMS Gold Aperture with 300 µm hole, 3 mm O.D., 0.12 mm thick
Advanced techniques of thin metal film application permits the apertures to retain a clean hole edge during prolonged beam exposure. Ultra-thin, half-micron design discourages contaminant accumulation and stabilizes astigmatic conditions to provide longer life. Conventional mechanical cleaning involving costly down-time is no longer necessary. Because the foil is ultra thin, care must be taken when handling the gold foil apertures.
Size: 300 µm
O.D.: 3 mm
Thickness: 0.12 mm
Electron Microscopy Sciences X-Ray Window Silicon Nitride Film, 1000 µm, 100 nm
Ideal substrates for x-ray microscopy and x-ray spectroscopy techniques. State-of-the-art manufacturing and expert engineering allow for competitive prices of these windows. Made in the USA, these X-Ray windows are entirely plasma cleanable to remove organic contamination. Flat, uniformly deposited films provide consistent backgrounds with low field-to-field variability and high x-ray transmission. For high temperature and differential pressure environments.
Dimensions: 1000 µm
Electron Microscopy Sciences SEM Stub with 75 mm Head and Pin 19 mm
A larger SEM aluminum sample holder for larger samples.
Height: 19 mm
Meiji Techno America Stage micrometer, 1mm divided into 100 units, 0.01mm
Stage micrometer, 1mm divided into 100 units, 0.01mm
Electron Microscopy Sciences Formvar Support Film 5-6 nm thick on Square 150 mesh Copper Grid
Support Film on grids has become a main product line for us since the demand for high quality coated grids has increased. To make your microscopy work easier and to save you a great deal of time we offer you a complete line. All of our coated grids are optically checked followed by batch testing in the EM. Packed in grid storage box. Standard coating is 5 to 6 nm thick.
Grid: Copper
Electron Microscopy Sciences MicroMounts™ Crystal Tool with 50 µm Aperture and 25 mm pin
MicroMounts are the high performance tools for manipulating and mounting protein crystals, virus crystals, and small molecule/inorganic crystals, and other small, fragile samples. They are ideal for both conventional and high-throughput X-ray crystallography applications.
Each consist of a thin (7.5um thick) micro-fabricated polyimide film, attached to a solid non-magnetic stainless steel pin. Film is wrapped around the steel pin and it provides excellent stiffness and convenient scoop-like action in retrieving and handling crystals.
Aperture: 25 mm pin
Electron Microscopy Sciences Single Cross Line Reticle RET 42, 21 mm, 9 µm Line width
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Line width: 9 µm
Electron Microscopy Sciences Thin Sample Holder, 15x10 mm Stub
Ideal for examination cross section of thin samples, such as wafers, multi-layer of capacitors, plastics, metals, etc. For most AMRAY: 1/2" diameter, 1/8" dia. Pin (3.1mm) with split openings up to 1/4" (6.4mm), with 15mm (9/16") pin height
Electron Microscopy Sciences Scale with Cross Line Microscope Graticle NE7, 24.5 mm, 10 mm with 0.1 mm spacing
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Horizontal micrometer scale 10mm long with crosslines at 0.1mm spacing. Surface chrome image.
Size: 24.5 mm
Divisions: 10 mm with 0.1 mm spacing
Surface: Chrome image