Microscope Lamps and Accessories
Electron Microscopy Sciences Microscope Graticule NE1 Horizontal, 20.4 mm, 10 mm with 0.1 mm subdivisions
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale.
Size: 20.4 mm
Electron Microscopy Sciences Crossed Scale Microscope Graticle NE17, 23 mm, 10 mm with 0.1 mm subdivisions
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Crossed micrometer scale.
Size: 23 mm
Divisions: 10 mm with 0.1 mm subdivisions
Surface: Chrome image
Electron Microscopy Sciences X-Ray Window Silicon Nitride Film, 1000 µm, 100 nm
Ideal substrates for x-ray microscopy and x-ray spectroscopy techniques. State-of-the-art manufacturing and expert engineering allow for competitive prices of these windows. Made in the USA, these X-Ray windows are entirely plasma cleanable to remove organic contamination. Flat, uniformly deposited films provide consistent backgrounds with low field-to-field variability and high x-ray transmission. For high temperature and differential pressure environments.
Dimensions: 1000 µm
Electron Microscopy Sciences Grain Sizing Reticle NG60, Custom
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: Custom
Method: EN 10247
Electron Microscopy Sciences Double Cross Lines Reticle RET 61, 21 mm, 0.075 mm Gap
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Gap: 0.075 mm
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 1/2" Head with 8 mm Pin, Aluminum, 1/8" Pin diameter
Slotted head pin stub mounts with tappered pin ends are for use with Cambridge, Phillips, Camscan, B&L, Etec, Zeiss. Made from ultra-pure aluminum with standard lathe finish.
Head: 1/2"
Pin height: 8 mm
Pin diameter: 1/8"
Electron Microscopy Sciences MohrPro R-201 Developer 1 QT
All chemicals are concentrated . One quart (0.95L) of concentrate mixed with water will make one gallon of working solution.
Electron Microscopy Sciences SEM Cylinder Mount 45° Angle 3/8" Surface, 3.1mm Pin, Aluminum
Scanning electron microscope specimen mount with 45 degree angle. Made from lathe finished ultra-pure aluminum.
Head: 1/2"
Electron Microscopy Sciences Coates & Welter SEM Mount 3/4" Head, 3/8 " Pin diameter, Aluminum
Coates & Welter aluminum specimen mounts for scanning electron microscopes.
Head: 3/4"
Pin diameter: 3/8"
Electron Microscopy Sciences Cambridge S4 Mark II, S-410 Pin Stub 1-1/2" head, 3/16" height, Aluminum
Scanning electron microscope specimen mounts for Cambridge S4, Mark II, and S-410. Made from ultra-pure aluminum.
Head: 1-1/4"
Height: 3/16"
Electron Microscopy Sciences CoverWell™ Imaging Chamber 1 well 20 mm, 750 µl Volume
CoverWell Imaging reusable press-to-seal silicone chambers form a removable enclosure for repeat staining or specimen repositioning. The chambers are designed to stabilize and support thick and free-floating specimens for confocal microscopy and imaging applications.
Diameter: 20 mm
Volume: 750 µl
O.D.: 25 mm x 25 mm
Electron Microscopy Sciences Double Cross Lines Reticle RET 64, 19 mm, 1.0 mm Gap
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Gap: 1.0 mm
Electron Microscopy Sciences Grid Reticle RET 73, 21 mm, 10 mm x 10 mm Scale, 1 mm squares Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Scale: 10 mm x 10 mm
Divisions: 1 mm squares
Line width: 25 µm
Electron Microscopy Sciences Microscope Graticule NE120 Horizontal, 21 mm, 20 mm with 100 divisions of 0.1 mm
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale.
Size: 21 mm
