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Electron Microscopy Sciences AFM Substrate Ultra-Flat Silicon Wafer 6", 150 mm diameter, <100> Orientation
Supplier: Electron Microscopy Sciences 7189302
These ultra-flat wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer.
Diameter: 150 mm
Orientation: <100>
Thickness: 675 µm±20 µm
Roughness: Typically 2-3Å
Resistivity: 10-20 Ohm-cm
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