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Electron Microscopy Sciences Calibration Specimen 300-2D, SEM Pin
Supplier: Electron Microscopy Sciences 801232DPIN
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Array of Posts. Pitch 297. Al bumps on Si. Use contact or TappingMode.
Mount: SEM Pin
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