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Electron Microscopy Sciences Calibration Standard Model 70-1D mounted on Steel Disk for A
SDP

Catalog No. 501901683
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A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: Silicon Oxide ridges on Silicon, 4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. For AFM, use in contact, intermittent contact (TappingMode) and other modes with image sizes from 100 to 3000 nm.

Catalog No. 50-190-1683 Supplier Electron Microscopy Sciences Supplier No. 801271DAFM
May include imposed supplier surcharges.
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A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: Silicon Oxide ridges on Silicon, 4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. For AFM, use in contact, intermittent contact (TappingMode) and other modes with image sizes from 100 to 3000 nm.

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