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Electron Microscopy Sciences FIB Sample and Grid Holder, Pin, 1"
SDP

Supplier:  Electron Microscopy Sciences 7595006

Encompass_Preferred

Holds a FIB sample mounted on a standard 25 mm (1") pin stub for FIB milling and lift out procedures. Can also be used to hold FIB grids of the same thickness to mount the prepared lamellae on an FIB grid for TEM imaging. This cost-effective and versatile holder is suitable for all FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems. For the JEOL and Hitachi systems, use a pin mount adapter. Convenient brass thumbscrews make loading and unloading easy.
Overall Dimensions: 50 x 29 x 13.5 mm (2" x 1⅛" x ⅝").
Pin: Standard 3.2 mm ( 1/8").
Material: Vacuum grade aluminum with brass screws.

Catalog No. 50-192-7131


May include imposed supplier surcharges.
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