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Electron Microscopy Sciences Ion Mill Stage, Model 5901
SDP

Supplier:  Electron Microscopy Sciences 5011801

Encompass_Preferred

The Ion Mill Stage is designed to accept the special SEM stub used with the Tripod Polisher. The SEM stub is mounted to the Ion Mill Stage and the samples are briefly ion milled in order to remove fine scratches, polishing debris and to give the surface topography prior to SEM analysis.  

Catalog No. 50-980-884


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