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Electron Microscopy Sciences Weibel 2 Graticle NGW2, 19mm
SDP

Supplier:  Electron Microscopy Sciences 6802519

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Used when making a surface to volume ratio of a structure per mass unit. This graticule consists of a number of short lines with interruptions as long as the lines. Basically, the number of intersections falling over the short lines is counted and the number of endpoints falling on the end of the structure is determined. Reference: E.R. Weibel, Journal of Microscopy Vol. 95. pp 373-378. Current Capabilities and Limitations of Available Sterrological Technique, point counting method.
Size: 19 mm

Catalog No. 50-297-09


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