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Electron Microscopy Sciences AFM Substrate Ultra-Flat Silicon Wafer 4", 100 mm diameter, <100> Orientation
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Catalog No. NC1513269
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These ultra-flat wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer.
Diameter: 100 mm
Orientation: <100>
Thickness: 525 µm±20 µm
Roughness: Typically 2-3Å
Resistivity: 10-20 Ohm-cm

Catalog No. NC1513269 Supplier Electron Microscopy Sciences Supplier No. 7189301
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These ultra-flat wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer.
Diameter: 100 mm
Orientation: <100>
Thickness: 525 µm±20 µm
Roughness: Typically 2-3Å
Resistivity: 10-20 Ohm-cm

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