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Electron Microscopy Sciences Single FIB Sample and Grid Holder, Pin, 1/2"
SDP

Catalog No. 501927128
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Holds a FIB sample mounted on standard 1/2" (12.7 mm) pin stub for FIB milling and lift-out procedures. Conveniently holds two FIB grids close to the sample to mount prepared TEM lamellae on the FIB grid for TEM imaging. Cost-effective holder suitable for all FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems.

Pin: Standard 3.2 mm ( 1/8"). For the JEOL and Hitachi systems, use a pin mount adapter.

Material: Vacuum grade aluminum with brass screws.

Catalog No. 50-192-7128 Supplier Electron Microscopy Sciences Supplier No. 7595003
May include imposed supplier surcharges.
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Holds a FIB sample mounted on standard 1/2" (12.7 mm) pin stub for FIB milling and lift-out procedures. Conveniently holds two FIB grids close to the sample to mount prepared TEM lamellae on the FIB grid for TEM imaging. Cost-effective holder suitable for all FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems.

Pin: Standard 3.2 mm ( 1/8"). For the JEOL and Hitachi systems, use a pin mount adapter.

Material: Vacuum grade aluminum with brass screws.

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