Promotional price valid on web orders only. Your contract pricing may differ. Interested in signing up for a dedicated account number?
Learn More

Electron Microscopy Sciences TEM Window Silicon Dioxide, (8) 100 µm, (1) 100x350 µm, 40nm
SDP

Supplier:  Electron Microscopy Sciences 7604290

Encompass_Preferred

By making the grids slightly narrower users now have easy access to grids in TEM holders. No more fumbling with tweezers while trying to pick up or put down grids. The new TEM Window grid shape is still compatible with all standard holders. TEM Window dimensions are 2.9mm in diameter and 100um thick.

Plasma Cleanable - can be vigorously plasma cleaned to remove organic contamination
Field to Field Uniformity - reduced variability
Tolerates temperatures above 1000°C - supports use in environmental TEMs where dynamic processes are observed at high temperatures
Withstands Harsh Conditions - Provides an ideal balance of imaging resolution, chemical stability and mechanical strength
Incorporates stoichiometric silicon dioxide - offers the ability to analyze for nitrogen by EDX techniques Lightly wrinkled with approximately 5um or less deflection in 100um of travel.
Dimensions: (8) 100 µm, (1) 100x350 µm
Thickness: 40 nm

Catalog No. 50-192-9472


May include imposed supplier surcharges.
Only null left
Add to Cart

Product Content Correction

The Fisher Scientific Encompass Program offers items which are not part of our distribution portfolio. These products typically do not have pictures or detailed descriptions. However, we are committed to improving your shopping experience. Please use the form below to provide feedback related to the content on this product.

Product Title

By clicking Submit, you acknowledge that you may be contacted by Fisher Scientific in regards to the feedback you have provided in this form. We will not share your information for any other purposes. All contact information provided shall also be maintained in accordance with our Privacy Policy.

Your feedback has been submitted: Thank you for helping us improve our website.