Promotional price valid on web orders only. Your contract pricing may differ. Interested in signing up for a dedicated account number?
Learn More
Learn More
Perkin Elmer US LLC TAMS Laser Alignment Tool
Supplier: Perkin Elmer US LLC L6310245
The Total Absolute Measurement System (TAMS) enables absolute measurement of directional reflectance and transmittance, as well as, BRDF/BTDF measurements, which is the characterization of the appearance of surfaces. The TAMS provides the widest wavelength range of measurement and the first upgradeable detector configuration in the industry. This system is used with Sphere and Direct Detectors, available in Si/InGaAs, Si and Si/PbS. The wavelength ranges between 190 and 3000 nm for both sample and reference beams, depending on the detector used. The open architecture of the LAMBDA platform provides solid mounting position for the TAMS, once the instrument detector module has been removed. Compatible with the LAMBDA 750/850/950/1050 spectrometers.
Product Title
By clicking Submit, you acknowledge that you may be contacted by Fisher Scientific in regards to the feedback you have provided in this form. We will not share your information for any other purposes. All contact information provided shall also be maintained in accordance with our Privacy Policy.
Spot an opportunity for improvement?