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Electron Microscopy Sciences Thin Sample Holder, 15 mm Pin
SDP

Supplier:  Electron Microscopy Sciences 7594815

Encompass_Preferred

Ideal for examination cross section of thin samples, such as wafers, multi-layer of capacitors, plastics, metals, etc. For ISI, JEOL, TOPCON: double set screw for a secure holding of the specimen during observation. 15mm(dia). X 10mm(H), 6.4mm split

Catalog No. 50-293-07


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