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Electron Microscopy Sciences High Magnification SEM Specimen Tin On Carbon on Grid, Hitachi Stub
Supplier: Electron Microscopy Sciences 7951704
This high magnification test is supported by a grid with tin dispersion over a carbon substrate. Range is about 3 - 60nm. The tin spheres are easily found on the grid. The grid allows the test to be level with the tin spheres.
Type: Hitachi Stub
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