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Electron Microscopy Sciences High Magnification SEM Specimen Tin On Carbon on Grid, ISI Stub
SDP

Supplier:  Electron Microscopy Sciences 7951703

Encompass_Preferred

This high magnification test is supported by a grid with tin dispersion over a carbon substrate. Range is about 3 - 60nm. The tin spheres are easily found on the grid. The grid allows the test to be level with the tin spheres.
Type: ISI Stub

Catalog No. 50-193-1215


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