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Electron Microscopy Sciences USAF Test Chart R75N Negative Image
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Supplier:  Electron Microscopy Sciences 6809804

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USAF resolution charts are recognized the world over as a universal standard for testing the vertical and horizontal resolution of imaging systems. Each element on the chart comprises three vertical bars and three horizontal bars, and the detail on these slides is as fine as 0.78microns (644 line-pairs per mm). The resolution of the imaging system is normally specified as the Group and Element of the finest bars that can be clearly defined. Sub Micron smallest feature size - bar width 0.00078mm [0.78 um].
Type: Negative Image
Use: Groups 0/1 to 9/3

Catalog No. 50-190-1575


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