Promotional price valid on web orders only. Your contract pricing may differ. Interested in signing up for a dedicated account number?
Learn More
Learn More
Electron Microscopy Sciences X-Checker™ Calibration Aid for SEM/EDS with boron nitride
Supplier: Electron Microscopy Sciences 80058BN
The X-Checker was the first and remains the only complete calibration aid for SEM/EDS Systems. Each X-Checker comes with manganese to measure full width at half max detector resolution, aluminum and copper to perform spectral calibration, and carbon to monitor calibration at the low end of the spectra for thin window detectors. You also get two grid sizes for checking the accuracy of your image analysis software and an easy test for monitoring the amount of vacuum pump oil contamination on your detector window. With: manganese, aluminum and copper, carbon, boron nitride.
Product Title
By clicking Submit, you acknowledge that you may be contacted by Fisher Scientific in regards to the feedback you have provided in this form. We will not share your information for any other purposes. All contact information provided shall also be maintained in accordance with our Privacy Policy.
Spot an opportunity for improvement?