Holds a FIB sample mounted on standard 1/2" (12.7 mm) pin stub for FIB milling and lift-out procedures. Conveniently holds two FIB grids close to the sample to mount prepared TEM lamellae on the FIB grid for TEM imaging. Cost-effective holder suitable for all FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems.
Pin: Standard 3.2 mm ( 1/8"). For the JEOL and Hitachi systems, use a pin mount adapter.
Material: Vacuum grade aluminum with brass screws.