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Electron Microscopy Sample Preparation Systems

Powered equipment for sample preparation and processing for analysis by electron microscopy (SEM, TEM, FIB), X-ray microtomography (microCT), electrical failure analysis (EFA), and related imaging systems.

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16 – 17 of 17 results
16

Morrell Instrument Company Inc MORRELL INSTRUMENT COMPANY INC

NC3903827 AT SPUTTER

ENCOMPASS_PREFERRED
17

Ted Pella Inc 60MM SPUTTER COATER TARGET

60mm Sputter Coater Target

ENCOMPASS