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This Test Specimen is made of a 5 mmx5 mm square of single crystal silicon. It is photo-etched and the squares repeat every 10 um. The dividing lines are 1.9 um wide.
A broader etching line is written every 500 um, which is useful in light microscopy. This is an excellent test specimen for comparing magnification and assessing any distortion in the image field. It is ideally useful in the context of automated counting systems to check for unsuspected distortions. Where critical measurements must be made the sample can be mounted directly onto the calibration specimen so that an internal calibration is obtained on the micro-graph.
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More
Small and Specialty Supplier Partner Small and/or specialty supplier based on Federal laws and SBA requirements. Learn More
For measurement of large objects and alignment in conjunction with a graduated mechanical stage. Single line, nominal width 0.02 mm, image covers entire field of view, surface chrome image. Size: 21mm Line width: 0.02 mm Surface: Chrome image
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More