Microscope Lamps and Accessories
Electron Microscopy Sciences PremaDisk Diamond Grinding Disc SM Medium-Hard Bond, 30 µm Particles, 300 mm diameter
PremaDisk Flexible Diamond Grinding Discs offer superior surface finishes that are usually only seen in lapping processes.
The SM disc is a medium-hard resin bond base for fine grinding and polishing of metals, ceramics and glass.
The SH disc is a hard resin bond base for applications where a very sharp edge must be maintained on the workpiece.
Both discs increase productivity by combining optimum surface quality, removal rates, and tool life in the same process.
Particles: 30 µm
Diameter: 300 mm
Electron Microscopy Sciences PremaDisk Diamond Grinding Disc SM Medium-Hard Bond, 30 µm Particles, 350 mm diameter
PremaDisk Flexible Diamond Grinding Discs offer superior surface finishes that are usually only seen in lapping processes.
The SM disc is a medium-hard resin bond base for fine grinding and polishing of metals, ceramics and glass.
The SH disc is a hard resin bond base for applications where a very sharp edge must be maintained on the workpiece.
Both discs increase productivity by combining optimum surface quality, removal rates, and tool life in the same process.
Particles: 30 µm
Diameter: 350 mm
Rarecyte RareCyte RarePlex Developer Kit: 405 nm, Leica
The Developer Kit (Version: 405-A-L) enables detection of an additional custom biomarker in the 405 nm channel on a CyteFinder instrument. Samples are stained by a Leica BOND RX automated staining system and are imaged on a CyteFinder Instrument. This kit must be paired with a RarePlex base kit (0900-LB) to run on automated stainer. The kit contains reagents needed for detection of a single channel (405 nm) biomarker stained with a customer‑provided rabbit or mouse antibody, instructions and protocols for staining and scanning and guidelines for interpreting results.
Electron Microscopy Sciences Diamond Disc 10" 1500 grit, PSA Steel Magnetc Back
Flexible Diamond Discs will reduce the number of steps in the grinding/polishing process along with a decrease in preparation time. Our Flexible Diamond Discs replace traditional SiC discs for most applications and give a superior finish and perfectly flat specimens. The patterned design minimizes build up of abraded material.
Particles: 1500 grit
Backing: PSA Steel Plate Magnetic
Electron Microscopy Sciences SEM Cylinder Mount 45° Angle 3/8" Surface, 3.1mm Pin, Aluminum
Scanning electron microscope specimen mount with 45 degree angle. Made from lathe finished ultra-pure aluminum.
Head: 1/2"
Electron Microscopy Sciences SEM Cylinder Mount 45° Angle 3/8" Surface, 3.1mm Pin, Aluminum
Scanning electron microscope specimen mount with 45 degree angle. Made from lathe finished ultra-pure aluminum.
Head: 1/2"
Electron Microscopy Sciences Chessy Test Specimen
This precise SEM calibration specimen consist of more than 1.6 million gold squares of 1 size on silicon forming a 4-fold checkerboard pattern in an area of 5 mm square. The smallest metric checkerboard has a size of 10 x 10. Such checkerboards form larger metric checkerboards of 100 x 100 - These again form checkerboards of 1 mm square. Finally, such 1mm squares are arranged in the same manner covering a field of 5 mm square.
The edges of the empty corners in 0.1 and 1 mm checkerboards are additionally marked. The surrounding frame is 10 wide and has an outer side length of 5.04 mm. The pattern was directly written by e-beam lithography using the new ZBA 31/32 from JENOPTIK.
Electron Microscopy Sciences Shorter Pin SEM Stub Slotted 1/2" Head with 5 mm Pin, Aluminum, 3.1 mm Pin diameter
SEM stub specimen mount with tapered end pin and slotted head for use with LEO SEMs. Made from ultra-pure aluminum with a standard lathe finish.
Head: 1/2"
Pin height: 5 mm
Electron Microscopy Sciences Carbon Support Film 5-6 nm thick on Square 200 mesh Copper Grid
A thin film of pure carbon. All of our coated grids are optically checked followed by batch testing in the EM. Packed in grid storage box. NOTE: All of our film is laid on the shiny side of the grid. Standard thickness is 5-6 nm.
Grid: Copper
Electron Microscopy Sciences Carbon Support Film 5-6 nm thick on Square 150 mesh Nickel Grid
A thin film of pure carbon. All of our coated grids are optically checked followed by batch testing in the EM. Packed in grid storage box. NOTE: All of our film is laid on the shiny side of the grid. Standard thickness is 5-6 nm.
Grid: Nickel
Electron Microscopy Sciences Broken Crosslines Microscope Graticle NE56, 21mm, Broken line
For measurement of large objects in conjunction with a graduated mechanical stage. Measurements in two directions and for sighting and alignment. Broken lines enable fine detail to be seen at the breaks. A thin boundary would be lost behind a a continuous line. Image covers the entire field of view. Surface chrome image.
Size: 21mm
Divisions: Broken line
Electron Microscopy Sciences Carbon Support Film 5-6 nm thick on Square 200 mesh Nickel Grid
A thin film of pure carbon. All of our coated grids are optically checked followed by batch testing in the EM. Packed in grid storage box. NOTE: All of our film is laid on the shiny side of the grid. Standard thickness is 5-6 nm.
Grid: Nickel
Electron Microscopy Sciences SEM Carbon Planchet, 12.7 mm, 1.6 mm height
Carbon planchet for scanning electron microscopy (SEM).
Surface: 1/2"
Height: 1.6 mm
Electron Microscopy Sciences SEM Carbon Planchet, 25.4 mm, 1.6 mm height
Carbon planchet for scanning electron microscopy (SEM).
Surface: 1"
Height: 1.6 mm
Electron Microscopy Sciences Carbon Support Film 5-6 nm thick on Square 400 mesh Nickel Grid
A thin film of pure carbon. All of our coated grids are optically checked followed by batch testing in the EM. Packed in grid storage box. NOTE: All of our film is laid on the shiny side of the grid. Standard thickness is 5-6 nm.
Grid: Nickel