Microscope Lamps and Accessories
Electron Microscopy Sciences SEM Stub Hitachi M4 4" Cylinder, 4.5mm height, Aluminum
SEM specimen mount with M4 large for use with Hitachi. Made from ultra-pure aluminum with a standard lathe finish.
Head: 4"
Height: 4.5 mm
Electron Microscopy Sciences Standard Pin SEM Stub Mini, 6.6 x 1.3 mm Head, 9.5 mm Pin, Copper
Mini SEM pin stub mount for Cambridge, Leica, ZEISS/LEO, FEI/Philips, CamScan, Tescan, ETEC and Amray. Made from lathe finished ultra-pure aluminum.
Head: 6.6 x 1.3 mm
Pin height: 3/8"
Electron Microscopy Sciences Standard Pin SEM Stub Mini, 6.6 x 1.3 mm Head, 9.5 mm Pin, Stainless
Mini SEM pin stub mount for Cambridge, Leica, ZEISS/LEO, FEI/Philips, CamScan, Tescan, ETEC and Amray. Made from lathe finished ultra-pure aluminum.
Head: 6.6 x 1.3 mm
Pin height: 3/8"
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 18 mm Head with 8 mm Pin, Carbon, 3.2 mm Pin diameter
Pin stub mount with slotted head for use with Cambridge, Leica, ZEISS/LEO, FEI/Philips, PHENOM, CamScan, and Tescan.
Head: 18 mm
Pin height: 8 mm
Electron Microscopy Sciences Embra Coordinator 100 mesh Grid, Copper
Standard 3.05 mm diameter grids with a handle.
Grid: Copper
Electron Microscopy Sciences Concentric Circles Microscope Graticle NE47, 16 mm, 10 circles 2 mm-20 mm
Can be used for two-way measurement when calibrated as a micrometer. There are 10 concentric circles 1mm-10mm in diameter. Surface chrome image.
Size: 16 mm
Electron Microscopy Sciences CoverWell™ Imaging Chamber 1 well 20 mm, 2.5mm depth, 50 µl Volume
CoverWell Imaging reusable press-to-seal silicone chambers form a removable enclosure for repeat staining or specimen repositioning. The chambers are designed to stabilize and support thick and free-floating specimens for confocal microscopy and imaging applications.
Diameter: 20 mm
Depth: 2.5 mm
Volume: 50 µl
O.D.: 25 mm x 25 mm
Morrell Instrument Company Inc CFI PLAN FLUOR 10X/0.30/16.00
NC3849804 CFI PLAN FLUOR 10X/0.30/16.00
Morrell Instrument Company Inc CFI APO LAMBDA D 2X/0.10/8.5MM
NC3849802 CFI APO LAMBDA D 2X/0.10/8.5MM
Electron Microscopy Sciences TEM Screen Recoating Hitachi Hs9, Hu11, H600 Inner Main
For optimum viewing, fluorescent screens should be recoated regularly. Viewing screens are easily damaged by the electron beam, especially at high accelerating voltages where knock-on damage can be severe. A proprietary process where 1 to 2 micron particles of phosphor are deposited on the screen and produce the highest possible resolution.
Ted Pella Inc PELCO TEM Grid Holder Block for 25 TEM Grids
The PELCO TEM grid holder blocks are designed to hold a number of TEM grids when they need to cleaned in a glow discharge system such as the PELCO easiGlow system or if they need to be coated in a carbon coater such as the Cressington 208C high vacuum carbon coater. The TEM grid holder blocks are made of a solid piece of vacuum grade aluminum and have recessed positions for each grid with slots for easy loading and lifting the grids with fine pointed tweezers. Each position also has an additional centre recess to avoid any contact with the grid support area and the block. Handling of TEM grids with these blocks is much easier and more secure than using glass slides. The PELCO TEM grid holder blocks are available in two sizes: 25 grids and 81 grids. The larger size is ideal for use coating system with a larger chamber or with rotary-tilting stages.
Electron Microscopy Sciences PS8 Micrometer Standard with Graticules Cert
These stage micrometers are available with a calibration certificate that provides traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, necessary under ISO provisions. The glass discs are mounted in stainless steel slides with engraved serial numbers. Each slide is supplied in a polished wooden storage case. A Certificate of Comparison from Pyser-SGI, Graticules Division compares the scale to a NPL calibrated in-house standards. A statemen is provided on the accuracy of the item with respect to these standards.
Electron Microscopy Sciences PS1 Micrometer Standard with Graticules Cert
These stage micrometers are available with a calibration certificate that provides traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, necessary under ISO provisions. The glass discs are mounted in stainless steel slides with engraved serial numbers. Each slide is supplied in a polished wooden storage case. A Certificate of Comparison from Pyser-SGI, Graticules Division compares the scale to a NPL calibrated in-house standards. A statemen is provided on the accuracy of the item with respect to these standards.