Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Hach Company 3/4 Inch Combination pH/ORP Sensor, Convertible Style, Ryton Body Material, General Purpose Glass pH Electrode, No Temperature Compensation, 15 ft Cable
Ryton, Convertible Body Style, 4.5m Analog Cable, General Purpose Glass pH Electrode, No Temperature Compensation
Electron Microscopy Sciences Broken Crosslines Microscope Graticle NE56, 19mm, Broken line
For measurement of large objects in conjunction with a graduated mechanical stage. Measurements in two directions and for sighting and alignment. Broken lines enable fine detail to be seen at the breaks. A thin boundary would be lost behind a a continuous line. Image covers the entire field of view. Surface chrome image.
Size: 19mm
Divisions: Broken line
Electron Microscopy Sciences High Resolution Magnification Calibration Specimen 150-2DUTC for AFM
Model 150-2D is a very high resolution reference and traceable standards for magnification calibration of AFM, SEM, Auger, and FIB. It has a precision, holographic pattern that provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
The period is 144 nm pitch, two-dimensional array that is accurate to +/- 1 nm (calibration certificate will have actual pitch.) Surface: Aluminum bumps on Silicon, 4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.
For SEM an independent analytical lab has tested this specimen in a FE-SEM and found that the pattern was very uniform and the specimen was easy to image. No significant charging was observed in the voltage range 1-20 kV. This traceable, Certified Standard is a select grade.
Electron Microscopy Sciences TEM Screen Recoating JEOL Inner Rectangle
For optimum viewing, fluorescent screens should be recoated regularly. Viewing screens are easily damaged by the electron beam, especially at high accelerating voltages where knock-on damage can be severe. A proprietary process where 1 to 2 micron particles of phosphor are deposited on the screen and produce the highest possible resolution.
Electron Microscopy Sciences Gilder Standard Square 100 mesh Cu/Pd Grid
A reliable support specimen grid source. Features well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected. 3.05 mm diameter, 0.7 mil (18 um) thickness.
Grid: Copper/Palladium
Pitch: 250 µm
Hole: 205 µm
Bar: 45 µm
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Electron Microscopy Sciences EMS Platinum Aperture with 10 µm hole, 0.24 mm thick
Platinum apertures are easily cleaned by either an aperture flamer or over a bunsen burner in the open air. We maintain a wide variety of Platinum Drilled Apertures in stock with different configurations suiting all of your needs. Nominal hole diameter: +/- 1 micron. Disc diameter: +/- 10 microns. Disc thickness: +/- 10 microns
Size: 10 µm
O.D.: 6 mm
Thickness: 0.24 mm
Electron Microscopy Sciences MicroMounts™ Crystal Tool with 30 µm Aperture and 25 mm pin
MicroMounts are the high performance tools for manipulating and mounting protein crystals, virus crystals, and small molecule/inorganic crystals, and other small, fragile samples. They are ideal for both conventional and high-throughput X-ray crystallography applications.
Each consist of a thin (7.5um thick) micro-fabricated polyimide film, attached to a solid non-magnetic stainless steel pin. Film is wrapped around the steel pin and it provides excellent stiffness and convenient scoop-like action in retrieving and handling crystals.
Aperture: 25 mm pin
Electron Microscopy Sciences Thin Sample Holder, 15 mm Pin
Ideal for examination cross section of thin samples, such as wafers, multi-layer of capacitors, plastics, metals, etc. For ISI, JEOL, TOPCON: double set screw for a secure holding of the specimen during observation. 15mm(dia). X 10mm(H), 6.4mm split
Electron Microscopy Sciences Formvar Support Film 5-6 nm thick on Square 400 mesh Copper Grid
Support Film on grids has become a main product line for us since the demand for high quality coated grids has increased. To make your microscopy work easier and to save you a great deal of time we offer you a complete line. All of our coated grids are optically checked followed by batch testing in the EM. Packed in grid storage box. Standard coating is 5 to 6 nm thick.
Grid: Copper
Electron Microscopy Sciences Gilder Thin Bar Hexagonal 600 mesh Nickel Grid
Thin Bar Grids have been developed using a new technology to produce ultra-fine grids with thinner cross bars than regular grids. The result is equally firm specimen support but with 40% more open area for viewing maximum specimen surface area. 3.05 diameter, 0.8 mil thickness.
Grid: Nickel
Pitch: 37 µm
Hole: 29 µm
Bar: 8 µm
Electron Microscopy Sciences Gilder Finder Grid F2, 200 mesh, Copper
Used to identify specific areas of mesh by an alphabetical or numerical code built into the mesh. 3.05 mm diameter, 0.7 mil (18 um) thickness. G200F2 series has thick bars dividing regions into 9 thin bar areas identified by alphabetical letters located in the center of the grid.
Grid: Copper
Pitch: 125 µm
Hole: 106 µm
Bar: 25-12 µm
Electron Microscopy Sciences MicroMounts™ Crystal Tool with 150 µm Aperture and 11 mm pin
MicroMounts are the high performance tools for manipulating and mounting protein crystals, virus crystals, and small molecule/inorganic crystals, and other small, fragile samples. They are ideal for both conventional and high-throughput X-ray crystallography applications.
Each consist of a thin (7.5um thick) micro-fabricated polyimide film, attached to a solid non-magnetic stainless steel pin. Film is wrapped around the steel pin and it provides excellent stiffness and convenient scoop-like action in retrieving and handling crystals.
Aperture: 11 mm pin
Electron Microscopy Sciences Microscope Graticule NE28 Horizontal, 19 mm, 1 mm with 100 subdivisions
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale.
Size: 19 mm
Electron Microscopy Sciences PremaDisk Diamond Grinding Disc SM Medium-Hard Bond, 15 µm Particles, 350 mm diameter
PremaDisk Flexible Diamond Grinding Discs offer superior surface finishes that are usually only seen in lapping processes.
The SM disc is a medium-hard resin bond base for fine grinding and polishing of metals, ceramics and glass.
The SH disc is a hard resin bond base for applications where a very sharp edge must be maintained on the workpiece.
Both discs increase productivity by combining optimum surface quality, removal rates, and tool life in the same process.
Particles: 15 µm
Diameter: 350 mm
Electron Microscopy Sciences Broken Crosslines Microscope Graticle NE56, 16mm, Broken line
For measurement of large objects in conjunction with a graduated mechanical stage. Measurements in two directions and for sighting and alignment. Broken lines enable fine detail to be seen at the breaks. A thin boundary would be lost behind a a continuous line. Image covers the entire field of view. Surface chrome image.
Size: 16mm
Divisions: Broken line