Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Gauge Pairs NE19, 21mm
Gauge pairs occupying a field of view of 10 mm. Each gauge is proportional to its adjacent number. The approximately size of the smallest pair = 0.1 mm.
Size: 21 mm
Electron Microscopy Sciences Chalkley Point Array Graticle NG52, 21mm
Eyepiece graticle is used to quickly determine the relationship of components to each other using random sampling. Curtis gives an example of its application, where a researcher may want to see whether or not a certain drug affects the volume proportion of cell types in a given organ. With this graticule the proportion of points lying over the image of one type of component is statistically proportional to the area occupied by that component. The 25 points of the array are placed over the field of view at random, so that a comparison can be made between the number of points touching the one type of component, with number touching the other type of component in each viewing. A series of observations will yield an increasingly accurate ratio of the comparative incidence of each type of particle.
Size: 21 mm
Electron Microscopy Sciences British Standard Graticle NG10, 19mm
In this graticule the circle areas double progressively, hence the diameters alter by Root 2, so that the size classes can form a continuation of the standard series of sieves for particle sizing. Each particle is assigned to a size class defined by two adjacent circles, which represent the size limits of that class. Thus the distribution of size is obtained in terms of the diameter of circles having the same projected area as the particles. This method will cover particles in the range 150 micron to 0.38 micron. The size distributions with respect to their number and weight are determined separately. Final results are calculated as cumulative percents.
Originally designed by the National Coal Board for use in coal mining.
Size: 19 mm
Electron Microscopy Sciences JEOL SEM Cylinder Mount 10 mm Head, 10 mm height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with standard lathe finish.
Head: 3/8"
Height: 3/8"
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-1.2/1.3-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 1.2 µm holes with 1.3 µm spacing.
Mesh: 400
Material: Copper
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1" surface, 1/2" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 1/2"
Electron Microscopy Sciences JEOL ISI SEM Cylinder Mount 5/8" surface, 3/8" height, Carbon
Cylinder specimen mounts are for use with JEOL and ISI scanning electron microscopes. The mounts are made from spectroscopically pure carbon.
Head: 5/8"
Height: 3/8"
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1/2" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL JSM-840 scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1/2"
Height: 3/8"
Electron Microscopy Sciences Probe With Eye, 8" length
5" long stainless steel probe with eye. 2 mm diameter. Flat one end with eye.
Electron Microscopy Sciences Calibration Specimen 300-2D, Unmounted
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. 300-2D, pattern: array of posts, nominal pitch: 300 nm, material: W-coated photoresist on Si.
Mount: Unmounted
Electron Microscopy Sciences Chalkley Point Array Graticle NG52, 19mm
Eyepiece graticle is used to quickly determine the relationship of components to each other using random sampling. Curtis gives an example of its application, where a researcher may want to see whether or not a certain drug affects the volume proportion of cell types in a given organ. With this graticule the proportion of points lying over the image of one type of component is statistically proportional to the area occupied by that component. The 25 points of the array are placed over the field of view at random, so that a comparison can be made between the number of points touching the one type of component, with number touching the other type of component in each viewing. A series of observations will yield an increasingly accurate ratio of the comparative incidence of each type of particle.
Size: 19 mm
Electron Microscopy Sciences Mertz Graticle NGM1, 21mm
Used to estimate the three-dimensional surface areas or the surface density of a component in a given volume, when the component does not have a random orientation. It comprises a test system with parallel curved lines used for measuring the intersection of points. Reference: W.A. Mertz. "Mikroskopic" Vol. 22 1967 pp 132-142.
Size: 21 mm
Electron Microscopy Sciences Omniprobe TEM Grid & Sample Holder, Stainless steel
TEM grid holder with stations for 2 TEM grids and 2 sample stubs. Long post – standard is 1/8" (3.2 mm) diameter x 0.32" (8.1 mm) length. Comes with 2 sample stubs. Stainless Steel is very slightly magnetic.
Electron Microscopy Sciences Cross Lines Graticle NE81, 19 mm, Nominal line width 0.040 mm
Used as NE50 but for measurements in two directions and for sighting and alignment. Image covers the entire field of view.
Size: 19 mm
Divisions: Nominal line width 0.040 mm
Surface: Chrome image