Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Calibration Specimen 300-1D, Unmounted
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. 300-1D, pattern: parallel ridges, nominal pitch: 300 nm, material: W-coated photoresist on Si.
Mount: Unmounted
Electron Microscopy Sciences Microscope Graticule NE28 Horizontal, 16 mm, 1 mm with 100 subdivisions
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Vertical micrometer scale.
Size: 16 mm
Electron Microscopy Sciences Microscope Graticule NE1 Horizontal, 21 mm, 10 mm with 0.1 mm subdivisions
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale.
Size: 21 mm
Electron Microscopy Sciences TEM Screen Recoating Hitachi H7000, H8000 Inner Main
For optimum viewing, fluorescent screens should be recoated regularly. Viewing screens are easily damaged by the electron beam, especially at high accelerating voltages where knock-on damage can be severe. A proprietary process where 1 to 2 micron particles of phosphor are deposited on the screen and produce the highest possible resolution.
Electron Microscopy Sciences Indexed Grid Reticle RET 83, 19 mm, 5 mm x 5 mm Scale, 1 mm squares Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Scale: 5 mm x 5 mm
Divisions: 1 mm squares
Line width: 10 µm
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-MH-2C, 200 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis.
Mesh: 200
Material: Copper
Electron Microscopy Sciences Grid Reticle RET 71, 21 mm, 5 mm x 5 mm Scale, 0.5 mm squares Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Scale: 5 mm x 5 mm
Divisions: 0.5 mm squares
Line width: 25 µm
Electron Microscopy Sciences Crossed Scale Microscope Graticle NE 72, 27 mm, 20 mm with 200 divisions of 0.1 mm
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. NE 72 Crossed Micrometer scale.
Size: 27 mm
Divisions: 20 mm with 200 divisions of 0.1 mm
Electron Microscopy Sciences Grain Sizing Reticle NG60, 21 mm
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: 21 mm
Method: EN 10247
Electron Microscopy Sciences TEM Screen Recoating JEOL 100c, 100cx, 200cx, Inner Rec
For optimum viewing, fluorescent screens should be recoated regularly. Viewing screens are easily damaged by the electron beam, especially at high accelerating voltages where knock-on damage can be severe. A proprietary process where 1 to 2 micron particles of phosphor are deposited on the screen and produce the highest possible resolution.
Electron Microscopy Sciences Eyepiece Scale NE45, 19mm
Full protractor scale is 10 mm in diameter and divided in degrees. Surface chrome image.
Size: 19 mm
Electron Microscopy Sciences Maxtaform London Finder Grid, 200 mesh Copper, 127 µm Pitch
Maxtaform grids with reference patterns are of the highest consistent quality.
Material: Copper
Pitch: 127 µm
Electron Microscopy Sciences Whipple Grid Graticle NE29, 21 mm, 100 squares in 7 mm
Originally designed for water particle analysis, but may be used for other aspects of particle counting. Grid showed: Ratio of full square to smallest is 50:1. Area is 2500:1. Reference: Microscopy of Drinking Water.
Size: 21 mm
Divisions: 100 squares in 7 mm