Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
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Filtered Search Results
Electron Microscopy Sciences Gilder Single Slot Oval Grid GS2/3x1, Copper, 606 x 1000 µm Slot
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Single Slot TEM Grids with oval holes have a thickness of are 50 microns. Each grid is individually inspected.
Material: Copper
Slot: 606 x 1000 µm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Rotatrim Rolling Trimmer Mono-Rail Cutter, 26"
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Designed for trimming papers and lightweight boards . Rotary blade is hardened Sheffield carbon steel, spring-tensioned and self-sharpening.
Size: 26"
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Embra Square 100 mesh Aluminum, 65% Open Area
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EMBRA electroformed grids combine a high open area with a rigid construction which allows for relatively easy handling. 3.05 mm diameter, 16 micron thick.
Grid: Aluminum
Open Area: 65%
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences JEOL JSM 840 SEM Cylinder Mount 1/2" surface, 1/4" height, Aluminum
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Cylinder specimen mounts are for use with JEOL JSM-840 scanning electron microscopes. The mounts are made from ultra-pure aluminum with standard lathe finish.
Head: 1/2"
Height: 1/4"
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Metallurgical Graticle G54, 16mm, ASTM 24
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Standard pattern discs for metallurgical stereometric analysis of grain size in polished metal sections. ASTM 24 point circular grid, glass sandwich.
Size: 16mm
Method: ASTM 24
Surface: Glass sandwich
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Chroma Technologies KEYENCE BZX MICROSCOPE ET- CY7
Chroma filter sets mounted in cubes for Keyence BZX Microscope ET- CY7 ET710/75x ET810/90m T760lpxr-UF1
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Electron Microscopy Sciences Gauge Pairs NE19, 16mm
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Gauge pairs occupying a field of view of 10 mm. Each gauge is proportional to its adjacent number. The approximately size of the smallest pair = 0.1 mm.
Size: 16 mm
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Electron Microscopy Sciences Cambridge SEM Carousel
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A standard carousel holder made to fit Cambridge SEMs. Will hold 8 pin stubs. Comes complete with hexagonal wrench.
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Standard Pin SEM Stub Slotted 3/8" head with 7/16" Pin, Aluminum, 3.1 mm Pin diameter
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Small, slotted head pin stub mounts are for Cambridge, LEO, Philips 500, Cameca SEMs. Made from lathe finished ultra-pure aluminum.
Head: 3/8"
Height: 7/16"
Pin diameter: 3.1 mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences SEM Mount Holder Box for JEOL
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Box with insert and lid.
Use: 10 mm x 10 mm cylinders
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Integrated EyePiece (Simplified) Graticle G50, Custom
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The eyepiece reticle has a 100 point integrating pattern. It is a slightly simplified version of G47 pattern.
Size: Custom
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Ted Pella Inc Ø3" Silicon Wafer, Type P / <111>
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These 3" diameter silicon wafers can be used either as a substrate for thin film research or to make small silicon substrates by dicing the wafer into smaller pieces using a scriber and the Wafer Cleaving / Glass Breaking Pliers. The wafer is shipped in a wafer carrier.
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Quality Control Testing Standard Set B
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Additional 1000 mesh and 2000 mesh grid included. On 32mm diameter block.
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences Cylinder Mount JEOL ISI ABT Topcon SEM 9.5 mm Head, 9.5 mm height, Aluminum
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Cylinder specimen mounts are for use with JEOL, ISI, ABT, and Topcon scanning electron microscopes. Made from ultra-pure aluminum with a standard lathe finish.
Head: 9.5 mm
Height: 9.5 mm
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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Electron Microscopy Sciences High Magnification SEM Specimen Tin On Carbon on Grid, JEOL Stub
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This high magnification test is supported by a grid with tin dispersion over a carbon substrate. Range is about 3 - 60nm. The tin spheres are easily found on the grid. The grid allows the test to be level with the tin spheres.
Type: JEOL Stub
Non-distribution item offered as a customer accommodation; additional freight charges may apply.
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