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Sigma Aldrich Fine Chemicals Biosciences Arsenic implant in silicon

Catalog No. 502907201
Encompass

This Standard Reference Material (SRM) is intended for use in calibrating secondary ion response to minor and trace levels of arsenic in a silicon matrix by the analytical technique of secondary ion mass spectrometry (SIMS). It may also be used by a laboratory as a transfer standard for the calibration of working standards of arsenic in silicon.For more information please refer to the SDS and COA.SRM 2134 cert SRM 2134 SDS

Catalog No. 50-290-7201 Supplier Sigma Aldrich Fine Chemicals Biosciences Supplier No. NIST2134
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This Standard Reference Material (SRM) is intended for use in calibrating secondary ion response to minor and trace levels of arsenic in a silicon matrix by the analytical technique of secondary ion mass spectrometry (SIMS). It may also be used by a laboratory as a transfer standard for the calibration of working standards of arsenic in silicon.For more information please refer to the SDS and COA.SRM 2134 cert SRM 2134 SDS

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