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Electron Microscopy Sciences MAC 21 Semi Conductor Auger Standards, 32 mm
SDP

Catalog No. 5025248
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MAC has developed multi-element blocks of reference materials suitable for the compilation of a reference library of Auger sensitivity factors when used with the Auger Electron Microscopy (AES). A carefully selected range of elements or compounds will enable the surface analyst to compile a valuable reference library of spectra. A Faraday Cup, for the accurate measurement of specimen current, is available as an option.

Multi-element blocks containing up to 50 reference materials can be made to suit the configuration of the most instrument. The reference material each has an exposed area about 2 square mm and are polished to a 1/4 micron diamond finish. The block of reference material is made from AISI 304 grade austenitic.

All blocks are supplied with certificates of analysis.
Size: 32 mm

Catalog No. 50-252-48 Supplier Electron Microscopy Sciences Supplier No. 80095SC32
May include imposed supplier surcharges.
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MAC has developed multi-element blocks of reference materials suitable for the compilation of a reference library of Auger sensitivity factors when used with the Auger Electron Microscopy (AES). A carefully selected range of elements or compounds will enable the surface analyst to compile a valuable reference library of spectra. A Faraday Cup, for the accurate measurement of specimen current, is available as an option.

Multi-element blocks containing up to 50 reference materials can be made to suit the configuration of the most instrument. The reference material each has an exposed area about 2 square mm and are polished to a 1/4 micron diamond finish. The block of reference material is made from AISI 304 grade austenitic.

All blocks are supplied with certificates of analysis.
Size: 32 mm

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