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Electron Microscopy Sciences Calibration Standard Model 70-1D with Cert Choose Mount
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Catalog No. 501901685
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A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: Silicon Oxide ridges on Silicon, 4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. Model 70-1D with Certificate. Choice of mount.

Catalog No. 50-190-1685 Supplier Electron Microscopy Sciences Supplier No. 801271DCX
May include imposed supplier surcharges.
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A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: Silicon Oxide ridges on Silicon, 4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. Model 70-1D with Certificate. Choice of mount.

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