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Vernier™ Diffraction Apparatus
SDPSCI_ED

Catalog No. S16001ND
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:
For Use With: Combination Track/Optics Bench

Includes

Diffraction Slit System, Red Diffraction Laser, Combination Linear Position and High Sensitivity Light Sensor, Power Supply

Requires

Requires an interface and software, sold separately

Use the Diffraction Apparatus to map light intensity vs. position for various slit geometries.

Red Laser Wavelength: 635 nm +/- 5 nm (Class 2 laser product) Light Sensor Full Scale Ranges: 1, 10, and 100 μW Linear Position Sensor range: 150 mm Linear Position Sensor resolution: 40 μm Available slits Single Slits (4) 0.02 mm 0.04 mm 0.08 mm 0.16 mm Variable Slits Wedge: 0.02 - 0.2 mm wide Double Slit: 0.04 mm wide, spacing 0.25 - 0.75 mm Double Slits (4 pairs) 0.04 mm wide at 0.125 mm apart 0.04 mm wide at 0.5 mm apart 0.08 mm wide at 0.25 mm apart 0.08 mm wide at 0.5 mm apart Variable Double Slit:Same as variable slits group above Multiple Slits 0.04 mm wide at 0.25 mm apart 4 sets, 2, 3, 4, 5 slits Comparisons: 4 pairs of single/double slits: 0.04 mm single + 0.04/0.25 mm double, doubles 0.04/0.25 +0.04/0.50, doubles 0.04/0.25+0.08/0.25, double 0.04/0.25 + triple, 0.04/0.25

Warranty and Services

5-year limited warranty

Specifications

For Use With (Application) Mapping light intensity
For Use With (Equipment) Combination Track/Optics Bench
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