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Electron Microscopy Sciences MAC Microanalysis Standard Stainless Steel Mount, 2, 3, or 5 mm
Supplier: Electron Microscopy Sciences 80074NBSSS
All of our standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems. They are supplied with fully authenticated certificates of analyses and a location map for standard identification. Mounts are polished to 0.25 micron diamond and carbon coated. Supplied in 2, 3, or5 mm brass tube.
Type: Mounted
Size: 2, 3, or 5 mm
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