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Electron Microscopy Sciences Fortress™ FIB Sample Holder
Supplier: Electron Microscopy Sciences 7595601
Reusable holder that secures FIB sample that are held in a specific orientation without the use of adhesives, adhesive tabs, or conductive paints. Can be used to position a thin, whole or cut TEM grid / disk in an orientation such that either in-situ or an ex-situ. FIB lift-out technique can be used to attach a FIB-prepared sample. Physical protection of the mounted sample on the grid is provided with the CastleGuard protection design. Can be stored in a single SS200 Sample Saver storage container. Holds a standard FIB lift out specimen on a grid or an H-Bar cut sample.
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