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Electron Microscopy Sciences Grating Replica, Crossed Line, 1 each
Supplier: Electron Microscopy Sciences 80051
Crossed: Cross line pitch spacing of 463nm with 2160 lines/mm in both directions, cross at 90 to one another give additional accuracy to magnification checks and aid in checking distortion. Trench-type groove makes it easy to measure pitch. Ideal for calibration electron-optical magnification up to the x80000/100000 range.
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