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Electron Microscopy Sciences EMS Image Analysis Grid Pattern Model IAM-5M, Medium, 200 µm Pitch
SDP

Supplier:  Electron Microscopy Sciences 602165MNG

Encompass_Preferred

This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20 mm x 50 mm.

Catalog No. 50-345-81


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