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Electron Microscopy Sciences EMS Image Analysis Grid Pattern Model IAM-5S, Small, 10 µm Pitch
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Catalog No. 5034582
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This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20 mm x 50 mm.

Catalog No. 50-345-82 Supplier Electron Microscopy Sciences Supplier No. 602165SNG
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This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20 mm x 50 mm.

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