Motic™ Panthera TEC Material Upright Trinocular Microscope

This Panthera TEC offers a high value for the inspection of semiconductors and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield and Cross-Polarization contrast are combined with a new, unique-to-Motic™ segmental illumination that all contribute to the versatility of this model.

Supplier:  Motic™ 1100104600231

Catalog No. 01-674-207

Description

The Panthera TEC is clearly focused on material sciences, filling the last gap in the Panthera family. Brightfield, Darkfield and simple Polarization contrast combined with a new segmental illumination allows for an oblique incident illumination, perfect for detection of scratches or other defects on flat and reflecting surfaces without a need to move the sample.

• LD Plan BD objectives with a high imaging performance, mounted on 5-fold encoded nosepiece
• Light intensity for each objective position is automatically memorized and will be repeated once the objective is swung in again
• Compact Epi illuminator carries a slot for polarizer and analyzer, ready for Polarization contrast and reducing internal reflections
• Illuminator also includes controls for varying incident light in terms of mode (BF or DF) and illumination angle
• Extended Field of View offers 21% more visual area in comparison to basic 20 mm FOV system
• Beam split (25° viewing angle) is fixed by 50/50 (vis/photo)
• Incident illumination is performed by a 3W LED of selectable color temperature
• Incident/transmitted stand type for compound materials additionally carries transmitted LED illumination system with 39 LEDs mounted in an LED condenser (here, a stage with glass insert will be applied)

Specifications

• Head Style: Trinocular
• Model: PanBD/DF/RL/TL
• Field of View: 22 mm
• Stage Size: 152.4 x 101.6 mm (6 x 4 in.)

• Lighting Type: LED
• Objective Types: LD Plan BD
• Nosepiece: 5-fold

Safety and Handling

WARNING: Cancer and Reproductive Harm - www.P65Warnings.ca.gov