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Electron Microscopy Sciences Reference Stage Graticule 75 mmx25 mm Slide
Supplier: Electron Microscopy Sciences 68049
High precision image analysis standard provides four test areas for calibrating image analysis systems and identifying deviations and distortions in optical imaging systems. It is produced on a 75 mm x 25 mm slide and has a square grid accuracy of +/-0.1um and a dot accuracy of +/-0.3um.
The four test areas are:
400 um x 400 um square grid subdivided into 200, 100, 50 and 25 micron squares for detecting gross image distortions and can be used as an accurate two dimensional stage micrometer.
A 20 x 17 array of nominally 15 um diameter dots is used to identify lens distortions.
A root-2 array of spots from 3 um to 48 um diameter is used for determining the threshold levels of cameras and microscopes.
A log-normal distribution array of 100 spots ranging from 4.5 um to 27 um diameter enables the mean and standard deviation to be determined and compared with certified values. This is an idealized distribution of maximum dynamic range for a full screen.
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