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Electron Microscopy Sciences SEM Aluminum Tungsten Dendrites
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Catalog No. 5027095
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The various spacings created by the dendritic structure give the gap test, and the topographical arrangement of the dendrites leads to the gray level test. The specimen is non-magnetic, vacuum clean. It is most useful for working in the probe size range of 25 to 75 nm. Supplied unmounted.

Catalog No. 50-270-95 Supplier Electron Microscopy Sciences Supplier No. 7951401
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The various spacings created by the dendritic structure give the gap test, and the topographical arrangement of the dendrites leads to the gray level test. The specimen is non-magnetic, vacuum clean. It is most useful for working in the probe size range of 25 to 75 nm. Supplied unmounted.

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