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Electron Microscopy Sciences Shorter Pin SEM Stub Slotted 38 mm head with 6 mm Pin, Aluminum, 1/8" Pin diameter
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Supplier:  Electron Microscopy Sciences 7518369

Encompass_Preferred

SEM stub specimen mount with shorter pin (6 mm) and 38 mm slotted head for use with Zeiss/LEO scanning electron microscopes, FE-SEMs & FIB systems. Made from ultra-pure aluminum with a standard lathe finish.
Head: 38 mm
Pin height: 6 mm
Pin diameter: 1/8"

Catalog No. 50-192-8151


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