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Electron Microscopy Sciences AFM Substrate Type P Silicon Wafer 3", 76 mm diameter, <111> Orientation
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Catalog No. NC1513272
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These silicon wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer. The wafers are polished on one side.
Diameter: 76 mm
Orientation: <111>
Thickness: 345-470 µm
Roughness: 2nm
Resistance: 1-30 ohms

Catalog No. NC1513272 Supplier Electron Microscopy Sciences Supplier No. 7189306
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These silicon wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer. The wafers are polished on one side.
Diameter: 76 mm
Orientation: <111>
Thickness: 345-470 µm
Roughness: 2nm
Resistance: 1-30 ohms

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