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Electron Microscopy Sciences AFM Substrate Type P Silicon Wafer 6", 150 mm diameter, <100> Orientation

Supplier: Electron Microscopy Sciences 7189308

These silicon wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer. The wafers are polished on one side.
Diameter: 150 mm
Orientation: <100>
Thickness: 600-690 µm
Roughness: 2nm
Resistance: 1-30 ohms
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