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Electron Microscopy Sciences MXS Calibration Standard 301BE for AFM, SEM, Pin, 300 nm Spacing
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Catalog No. 501901676
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EMS offers a series of calibration standards with one and two dimension calibrated patterns. These standards are created utilizing holographic interference of a particular laser frequency. They are typically accurate to <1% across the entire surface of the standard. These reference standards are remarkably durable under typical operating conditions. The surface contamination behavior is also very good. There are no better sub-micron reference standard available in this price range. For AFM, SEM, TOF-SIMS, Auger
Mount: Pin
Spacing: 300 nm
Structure: Parallel Ridges
Material: Ti lines on silica

Catalog No. 50-190-1676 Supplier Electron Microscopy Sciences Supplier No. 8011131PIN
May include imposed supplier surcharges.
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EMS offers a series of calibration standards with one and two dimension calibrated patterns. These standards are created utilizing holographic interference of a particular laser frequency. They are typically accurate to <1% across the entire surface of the standard. These reference standards are remarkably durable under typical operating conditions. The surface contamination behavior is also very good. There are no better sub-micron reference standard available in this price range. For AFM, SEM, TOF-SIMS, Auger
Mount: Pin
Spacing: 300 nm
Structure: Parallel Ridges
Material: Ti lines on silica

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