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Electron Microscopy Sciences High Magnification SEM Specimen Tin On Carbon on Grid, JEOL Stub
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Catalog No. 501931214
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This high magnification test is supported by a grid with tin dispersion over a carbon substrate. Range is about 3 - 60nm. The tin spheres are easily found on the grid. The grid allows the test to be level with the tin spheres.
Type: JEOL Stub

Catalog No. 50-193-1214 Supplier Electron Microscopy Sciences Supplier No. 7951702
May include imposed supplier surcharges.
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This high magnification test is supported by a grid with tin dispersion over a carbon substrate. Range is about 3 - 60nm. The tin spheres are easily found on the grid. The grid allows the test to be level with the tin spheres.
Type: JEOL Stub

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