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Electron Microscopy Sciences Low Magnification SEM Test Specimen Tin On Carbon, 12.5mm Pin Stub
SDP

Supplier:  Electron Microscopy Sciences 7951801

Encompass_Preferred

This low magnification test has a size range of 1 - 10μm for table-top SEM. Has a magnification range of 250-5,000x. Can be used on FESEM and FIB as well.
Type: 12.5mm Pin Stub

Catalog No. 50-193-1217


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