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Electron Microscopy Sciences Low Magnification SEM Test Specimen Tin On Carbon, Hitachi Stub
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Catalog No. 501931220
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This low magnification test has a size range of 1 - 10μm for table-top SEM. Has a magnification range of 250-5,000x. Can be used on FESEM and FIB as well.
Type: Hitachi Stub

Catalog No. 50-193-1220 Supplier Electron Microscopy Sciences Supplier No. 7951804
May include imposed supplier surcharges.
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This low magnification test has a size range of 1 - 10μm for table-top SEM. Has a magnification range of 250-5,000x. Can be used on FESEM and FIB as well.
Type: Hitachi Stub

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