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Electron Microscopy Sciences High Magnification SEM Specimen Tin On Carbon on Grid, 12.5mm Pin Stub
SDP

Catalog No. 501931213
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This high magnification test is supported by a grid with tin dispersion over a carbon substrate. Range is about 3 - 60nm. The tin spheres are easily found on the grid. The grid allows the test to be level with the tin spheres.
Type: 12.5mm Pin Stub

Catalog No. 50-193-1213 Supplier Electron Microscopy Sciences Supplier No. 7951701
May include imposed supplier surcharges.
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This high magnification test is supported by a grid with tin dispersion over a carbon substrate. Range is about 3 - 60nm. The tin spheres are easily found on the grid. The grid allows the test to be level with the tin spheres.
Type: 12.5mm Pin Stub

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