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Electron Microscopy Sciences SEM Ultra High Resolution Gold on Carbon Test Specimen, 12.5mm Pin Stub
SDP

Supplier:  Electron Microscopy Sciences 7951201

Encompass_Preferred

With gold particles ranging from <1 nm to 20 nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source. A magnification of at least 80,000x is required for this test.
Mount: 12.5mm Pin Stub

Catalog No. 50-295-50


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