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Electron Microscopy Sciences MAC Universal Set with 32 mm dia Block
SDP

Catalog No. 5029566
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Standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems. The 42 standards for general Energy Dispersive Analysis are mounted in 25 mm or 32 mm diameter brass stub. Includes Ag, Al2O3, Au, BaF2, Bi, CaSiO3, Cd, CeAl2, Co, Cr, Cu, Fe, FeS2, GaP, Ge, Hf, HgTe, InAs, Ir, KAlSi3O8, LaB6, MgO, Mn, Mo, NaAlSi3O8, Nb, Ni, PbTe, Pd, Pt, Rh, Sb, Se, Sn, SrF2, Ta , Ti, V, W, Y, Zn, and Zr.

Standards are polished to a 0.25 micron diamond finish and carbon coated. They are supplied with fully authenticated certificates of analyses and a location map for standard identification. Mounted in 25mm diameter brass stub.

Catalog No. 50-295-66 Supplier Electron Microscopy Sciences Supplier No. 8007132
May include imposed supplier surcharges.
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Standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems. The 42 standards for general Energy Dispersive Analysis are mounted in 25 mm or 32 mm diameter brass stub. Includes Ag, Al2O3, Au, BaF2, Bi, CaSiO3, Cd, CeAl2, Co, Cr, Cu, Fe, FeS2, GaP, Ge, Hf, HgTe, InAs, Ir, KAlSi3O8, LaB6, MgO, Mn, Mo, NaAlSi3O8, Nb, Ni, PbTe, Pd, Pt, Rh, Sb, Se, Sn, SrF2, Ta , Ti, V, W, Y, Zn, and Zr.

Standards are polished to a 0.25 micron diamond finish and carbon coated. They are supplied with fully authenticated certificates of analyses and a location map for standard identification. Mounted in 25mm diameter brass stub.

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