Microscope Lamps and Accessories
Electron Microscopy Sciences EMS Linear (X&Y) Stage Micrometer, Model IAM-2
A dual axis linear micrometer that can accurately calibrate both X and Y directions without rotation, for optical magnification, and camera aspect ratio using single standard. In addition, it can be used to calibrate and check linear stage motion or related auto measuring systems. Scales are in both English and Metric measurements.
Electron Microscopy Sciences Cross Lines Graticle NE81, 16 mm, Nominal line width 0.040 mm
Used as NE50 but for measurements in two directions and for sighting and alignment. Image covers the entire field of view.
Size: 16 mm
Divisions: Nominal line width 0.040 mm
Surface: Chrome image
Electron Microscopy Sciences Chessboard Squares Graticle NE15, 21mm
The dark squares are translucent. Used as an alternative to simple grids for area of specimen determination and paricle counting. Alternative light and dark squares help to reduce eyestrain.
Size: 21mm
Divisions: 2.0 mm squares
Electron Microscopy Sciences Cross Lines Graticle NE82, 16 mm, Nominal line width 0.005 mm
Used as NE50 but for measurements in two directions and for sighting and alignment. Image covers the entire field of view.
Size: 16 mm
Divisions: Nominal line width 0.005 mm
Surface: Chrome image
Electron Microscopy Sciences Cross Lines Graticle NE8, 21 mm, Nominal line width 0.020 mm
Used as NE50 but for measurements in two directions and for sighting and alignment. Image covers the entire field of view.
Size: 21 mm
Divisions: Nominal line width 0.020 mm
Surface: Chrome image
Electron Microscopy Sciences SEM Pin Stub Zeiss Flat End Pin, Slotted 1/2" head, Aluminum
Zeiss SEM mounts. Flat end pin and slotted head. Made from ultra-pure aluminum with standard lathe finish.
Head: 1/2"
Height: 1/8"
Electron Microscopy Sciences ISI, ABT, Topcon SEM Cylinder Mount 23.7 mm surface, 9.5 mm height, Aluminum
ISI, ABT, Topcon specimen mounts are made from ultra-pure aluminum, lathe finish.
Head: 23.7 mm
Height: 9.5 mm
Electron Microscopy Sciences JEOL SEM JSM 840 Cylinder Mount 1" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL JSM-840 scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 3/8"
Electron Microscopy Sciences ISI, ABT, Topcon SEM Cylinder Mount 23.7 mm surface, 9.5 mm height, Aluminum
ISI, ABT, Topcon specimen mounts are made from ultra-pure aluminum, lathe finish.
Head: 23.7 mm
Height: 9.5 mm
Electron Microscopy Sciences JEOL JSM 840 SEM Cylinder Mount 1/2" surface, 1/4" height, Aluminum
Cylinder specimen mounts are for use with JEOL JSM-840 scanning electron microscopes. The mounts are made from ultra-pure aluminum with standard lathe finish.
Head: 1/2"
Height: 1/4"
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1/2" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1/2"
Height: 3/8"
Electron Microscopy Sciences Combination 45°-90° SEM Pin Mount, Aluminum
SEM mount with an aluminum slotted head with 3.1 mm diameter pin, fits most SEMs.
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1" surface, 1/2" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 1/2"
Electron Microscopy Sciences SEM Mount Hitachi S-500 Threaded Pin, 1" Head, Aluminum
Hitachi S-500 threaded pin SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 1"
Height: 1/4"
Electron Microscopy Sciences JEOL ISI SEM Cylinder Mount 5/8" surface, 5/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL and ISI scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 5/8"
Height: 5/8"