Microscope Lamps and Accessories
Electron Microscopy Sciences High Resolution Magnification Calibration 150-2D For AFM
Model 150-2D is a very high resolution reference and traceable standards for magnification calibration of AFM, SEM, Auger, and FIB. It has a precision, holographic pattern that provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
The period is 144 nm pitch, two-dimensional array that is accurate to +/- 1 nm (calibration certificate will have actual pitch.) Surface: Aluminum bumps on Silicon, 4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.
For SEM an independent analytical lab has tested this specimen in a FE-SEM and found that the pattern was very uniform and the specimen was easy to image. No significant charging was observed in the voltage range 1-20 kV. Comes with a non-traceable, manufacturer's certificate.
Electron Microscopy Sciences Scale Reticle RET 16, 19 mm, 10 mm Scale, 0.05 mm x 200 Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Scale: 10 mm
Divisions: 0.05 mm x 200
Electron Microscopy Sciences Crossed Gauge Lines Microscope Graticule NE 54, 21mm
Use as crossed lines, but for the measuring of distances between thelines. Greater accuracy can be obtained by locatng the specimen detail between the graticules gauge pair.
Size: 21mm
Divisions: Two vertical lines 0.2 mm apart
Electron Microscopy Sciences Microscope Graticule NE31 Horizontal, 16 mm, 0.5" with 100 divisions of 0.0005"
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale.
Size: 16 mm
Electron Microscopy Sciences Indexed Grid Graticle NE71, 26 mm, 20 x 20 Grid of 0.5 mm squares
Useful for particle counting, particularly when reference is needed between workers. Also, they are useful for area of specimen determinations. Index Pattern.
Size: 26 mm
Divisions: 20 x 20 Grid of 0.5 mm squares
Electron Microscopy Sciences Cross Scale Reticle RET 32, 21 mm, 20 mm Scale, 0.10 mm x 200 Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Scale: 20 mm
Divisions: 0.10 mm x 200
Electron Microscopy Sciences Crossed Scale Microscope Graticle NE70 (imperial), 26 mm, 0.8' with 400 divisions of 0.002"
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Crossed Micrometer scale (imperial).
Size: 26 mm
Divisions: 0.8' with 400 divisions of 0.002"
Surface: Chrome image
Electron Microscopy Sciences Single Cross Line Reticle RET 43, 21 mm, 25 µm Line width
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Line width: 25 µm
Electron Microscopy Sciences Matthews Spray Droplet Graticle NE30, 21mm
For size and distribution assessments of aersol droplets. Used in conjunction with a 40X Microscope for direct measurements of droplets from 50-400 micron diameters. The actual pattern sizes are 50, 100, 200, and 400 microns. W.H.O. (Details on Request) and G.A. Matthews. Imperial College.
Size: 21 mm
Electron Microscopy Sciences Lennox Grain Analysis Graticle NG21, 21mm
The eyepiece reticle is used for Lennox grain size analysis. The pattern comprises and array of dashed squares and crosses.
Size: 21 mm
Electron Microscopy Sciences Dual Micrometer Calibration Slide PS52P with UKAS
Dual imperial/metric scales calibration slide. 50 mm in 0.1 mm divisions and 2" in 0.005" divisions. In wooden case. Ideal for calibrating optical products with a large field of view, such as stereo microscopes or imaging systems. For transmitted light applications and has a bright chrome positive image. 76 mm x 25 mm.
Electron Microscopy Sciences Scale Reticle RET 12, 21 mm, 20 mm Scale, 0.1 mm x 200 Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Scale: 20 mm
Divisions: 0.1 mm x 200
Electron Microscopy Sciences Crossed Gauge Lines Microscope Graticule NE 54, 16mm
Use as crossed lines, but for the measuring of distances between thelines. Greater accuracy can be obtained by locatng the specimen detail between the graticules gauge pair.
Size: 16mm
Divisions: Two vertical lines 0.2 mm apart
Electron Microscopy Sciences Scale with Cross Line Microscope Graticle NE777, 16 mm, 0.5" with divisions of 0.005"
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Horizontal micrometer scale 0.5" long with divisions of 0.005".
Size: 16 mm
Divisions: 0.5" with divisions of 0.005"
Electron Microscopy Sciences Indexed Grid Graticle NE71, 23 mm, 20 x 20 Grid of 0.5 mm squares
Useful for particle counting, particularly when reference is needed between workers. Also, they are useful for area of specimen determinations. Index Pattern.
Size: 23 mm
Divisions: 20 x 20 Grid of 0.5 mm squares